JEOL JSM-6500F Field Emission Scanning Electron Microscope  Introduction
Manual
 Model:JEOL JSM-6500F Year:2003
Location: Center for Condensed Matter Sciences, Room B105 CNST Map NTU Map
Observe the surface of the sample.
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Resolution: 1.5nm (15kV), 5.0 nm (1.0KV)
Accelarating Voltage: 0.5 to 30 kV (100V steps)
Magnification: x10 to 500,000
Maxdimension of the sample: 15.0mm (redius) X 10mm (height) |
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